Defect Art

X-ray topography reveals the intricate defect structure of crystals. Topographs of single crystal wafers of GaAs used in the manufacture of high speed circuits often reveal two common crystal defects: a cellular dislocation network and low angle grain boundaries. This topograph captures a rare instance which shows that the two dislocation types are not distinct. The cell boundaries of the cellular dislocation network can cooperatively give rise to a much larger low angle grain boundary, and in this instance do so in a very interesting and aesthetically pleasing way.

(Quill, stylus, plume, feather, spray)

I.C. Bassignana and D.A. Macquistan
Bell-Northern Research Ltd.
Category 2 (Open)

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